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X-ray fluorescence (XRF) analysis is a non-destructive method that can test the secondary characteristic x-rays (x-ray fluorescence) generated by the sample when the primary x-ray exciting the sample. This method can realize the fast measurement of the solid and liquid samples. XRF6 EDXRF Spectrometer is Persee's new type of high-end analytical instrument. It combines Persee's years of experience elements testing with unique product configurations and fully functional software. Its ergonomically design and friendly software interfaces grant the users a simple measurement job.
◆ Detector: SDD (Silicon Drift Detector) detector; High-quality energy resolution.
◆ Digital multi-channel technology: XRF60 use the industry's most advanced technology -digital multi-channel technology which can provide higher detection limit and accuracy.
◆ X-ray tube and system design: high-power x-ray tube and well system design provide excellent precious metal excitation and work efficiency
Data processing systems: special design application software, user-friendly interface.
◆ Collimating optical system: automatic replacement collimated optical system can meet a variety of user requirements.
◆ Sample observation systems: CCD camera.
◆ Shutter system: Replace the sample without closing high pressure; improve test efficiency and accuracy; the interlock design can ensure the safety of operator.
|Element range||Al ~ U|
|Content range||1 ppm ~ 99.99 %|
|Stability||<0.1 % (content>96 %)|
|Repeatability||<0.02 % (content>96 %)|
|Test time||60 ~ 300 s|
|Exciting power||50 W|
|Detector energy resolution||<145 eV|
|Radiation dosage||<0.2 μ Sv/h|
|Test object||Solid, powder, liquid|
|Temperature||0 ~ 40 ℃|
|Power||AC 110V/220V, 5A|