XRF6
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X-ray fluorescence (XRF) analysis is a non-destructive method that can test the secondary characteristic x-rays (x-ray fluorescence) generated by the sample when the primary x-ray exciting the sample. This method can realize the fast measurement of the solid and liquid samples. XRF6 EDXRF Spectrometer is Persee's new type of high-end analytical instrument. It combines Persee's years of experience elements testing with unique product configurations and fully functional software. Its ergonomically design and friendly software interfaces grant the users a simple measurement job.
Key Features
◆ Detector: SDD (Silicon Drift Detector) detector; High-quality energy resolution.
◆ Digital multi-channel technology: XRF60 use the industry's most advanced technology -digital multi-channel technology which can provide higher detection limit and accuracy.
◆ X-ray tube and system design: high-power x-ray tube and well system design provide excellent precious metal excitation and work efficiency
Data processing systems: special design application software, user-friendly interface.
◆ Collimating optical system: automatic replacement collimated optical system can meet a variety of user requirements.
◆ Sample observation systems: CCD camera.
◆ Shutter system: Replace the sample without closing high pressure; improve test efficiency and accuracy; the interlock design can ensure the safety of operator.
Specifications
Element range | Al ~ U |
Content range | 1 ppm ~ 99.99 % |
Stability | <0.1 % (content>96 %) |
Repeatability | <0.02 % (content>96 %) |
Test time | 60 ~ 300 s |
Exciting power | 50 W |
Detector energy resolution | <145 eV |
Radiation dosage | <0.2 μ Sv/h |
Test object | Solid, powder, liquid |
Weight | 81.5 lb |
Temperature | 0 ~ 40 ℃ |
Humidity | <80 % |
Power | AC 110V/220V, 5A |