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XD-6, XD-3, XD-2

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X-ray powder diffractometer is the basic instrument on studying and indentifying the composition and structure of material. The applied field is showed as follow:


1. The atom arrangement of all kinds of compound in material could be determined. Some particular performance of material is related with atom arrangement.


2. The composition of material could be determined.


3. The ratio of all kinds compound could be determined.


4. The grain size, stress, texture, orientation and crystallizability.


XD-6 is with vertical multifunction goniometer (θs-θd) which is fit for the samples from normal powder and massive solid to very big and irregular solid and ropy liquid.


The type of vertical θs-θd goniometer means the sample holder fixed, the X-ray source and detector turned.



Key Features


◆ Vertical multifunction high precision goniometer: the minimal step size is 0.00025°. mechanical repeatability excels 0.0006°. θ-2θ goniometer could be selected, which is fit for normal powder and massive solid samples.


◆ Easy use and convenient maintenance: the sample is set horizontally because of the vertical goniometer. The sample is more conveniently put in. the sample stage is more conveniently cleaned up. The goniometer could not be polluted and the precision of goniometer is not influenced.


◆ High performance: the report of customer operating instrument for 8 months could be provided. The standard deviation of diffraction angle of αSiO2 is better than 0.0015°.


◆ Attention to the design of security mechanical: cabinets design and goniometer shutter using a chain institutions, has not yet specified the location of X-ray can not be opened, to prevent leakage of X-ray.


◆ A variety of option can extend system functionality: in accordance with the purpose of analysis, you can choose parallel light film annex, texture annex, high temperature annex, φ scanning and a variety of optional accessories.


X-Ray Diffractometer - Brochure


Specifications


XD-6XD-3XD-2
X-ray tube


TypeCu target, NF modelCu target, NF modelCu target, NF model
Focus dimensions1.0 x10 mm²1.0 x10 mm²1.0 x10 mm²
Maximum power2 kW2 kW2 kW
X-ray generator


Maximum power4 kW 3 kW 3 kW 
X-ray tube voltage15-60 kV15-60 kV15-60 kV
Tube voltage step width1 kV1 kV1 kV
X-ray tube current6-80 mA6-50 mA6-50 mA
Tube current stop width1 mA1 mA1 mA
Tube voltage, tube current stability≤0.01 % (Supply voltage fluctuations 10 %)≤0.01 % (Supply voltage fluctuations 10 %)≤0.01 % (Supply voltage fluctuations 10 %)
Alarm devicekV low, kV overtop, mA overload, water discharge, temperaturekV low, kV overtop, mA overload, water discharge, temperaturekV low, kV overtop, mA overload, water discharge, temperature
Ray power protection0.35, 0.7, 1.0, 1.5, 2.0, 2.7 kW, six grade0.35, 0.7, 1.0, 1.5, 2.0, 2.7 kW, six grade0.35, 0.7, 1.0, 1.5, 2.0, 2.7 kW, six grade
Goniometer


Goniometer TypeVertical (θ-θ)Vertical (θ-2θ)Vertical (θ-2θ)
Scanning radius

150-285 mm

Continuously Adjustable

180 mm180 mm
Scanning modeθsd linkage or θsd single moveθsd linkage or θsd single moveθ-2θ linkage or θ-2θ single move
Measurement range -30°-80° (θs)
        -30°-160° (θd)
 -30°-80° (θs)
        -30°-160° (θd)
 -182°-180° (θs)
        -30°-160° (θd)
Operation modeContinuous scanning, Timing Step Scanning, Constant Step ScanningContinuous scanning, Timing Step Scanning, Constant Step ScanningContinuous scanning, Timing Step Scanning, Constant Step Scanning
Continuous scanning speed0.125°-120°/min0.125°-120°/min0.125°-120°/min
Maximum Speed
1800 °/min120 °/min120 °/min
Angle repeatability0.0005°0.0006°0.0006°
Measurement accuracy0.001°0.001°0.001°
Minimum step size0.0001°0.00025°0.00025°
Divergence slit (DS)0.15°, 0.5°, 1°, 2°0.15°, 0.5°, 1°, 2°0.15°, 0.5°, 1°, 2°
Anti- scattering slit (SS)0.5°, 1°, 2°0.5°, 1°, 2°0.5°, 1°, 2°
Receiving Slit (RS)0.1, 0.15, 0.3, 0.45, 0.6, 1, 2 mm0.1, 0.15, 0.3, 0.45, 0.6, 1, 2 mm0.1, 0.15, 0.3, 0.45, 0.6, 1, 2 mm
Zero dedicated slit 0.02 mm0.02 mm0.02 mm
Detection- Counter0.02 mm

The type of detectorScintillator CounterScintillator CounterScintillator Counter
Crystal typeNalNalNal
Pulse- height analyzer(PHA)Output High Voltage 0-1000 V stability ≤0.01 %  (8 h)Output High Voltage 0-1000 V stability ≤0.01 %  (8 h)Output High Voltage 0-1000 V stability ≤0.01 %  (8 h)
Machine cabinet


Cabinet size (in)47 L x 32 W x 73 H47 L x 32 W x 73 H47 L x 32 W x 73 H
Machine weight (lb)1,1001,1001,100
Observation window (in)24 L x 16 W x 0.4, Lead glass24 L x 16 W x 0.4, Lead glass24 L x 16 W x 0.4, Lead glass
X-ray leakage≤0.2 μ Sv/h(non deduction natural background)≤0.2 μ Sv/h(non deduction natural background)≤0.2 μ Sv/h(non deduction natural background)
Safety precautionsDoor interlock protection (The door to a designated location, light gates open only to produce X-ray)Door interlock protection (The door to a designated location, light gates open only to produce X-ray)Door interlock protection (The door to a designated location, light gates open only to produce X-ray)
Filter- Monchromator


Ni filterCorresponding Cu targetCorresponding Cu targetCorresponding Cu target
Graphite curved- crystal monochromatorReflection efficiency η≥28 %Reflection efficiency η≥28 %Reflection efficiency η≥28 %
Integrated whole stability≤0.3 %≤0.3 %≤0.3 %



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